{"id":38791,"date":"2020-04-27T11:45:11","date_gmt":"2020-04-27T09:45:11","guid":{"rendered":"\/elettronica\/?page_id=38791"},"modified":"2021-11-04T10:14:37","modified_gmt":"2021-11-04T09:14:37","slug":"collaborations","status":"publish","type":"page","link":"\/elettronica\/en\/collaborations\/","title":{"rendered":"Activity"},"content":{"rendered":"\n<h3 style=\"text-align: center\">Some assignment highlights of the Electronics Centre &#8211; 2019<\/h3>\n<h3 style=\"text-align: center\">\u00a0<\/h3>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38918 size-medium\" title=\"Assembly of the test crate for the DRM2 cards at CERN [ALICE]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Cratedi-test-delle-schede-DRM2-300x200.jpg\" alt=\"Assembly of the test crate for the DRM2 cards at CERN [ALICE]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Cratedi-test-delle-schede-DRM2-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Cratedi-test-delle-schede-DRM2.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Assembly of the test crate for the DRM2 cards at CERN [ALICE]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38927 size-medium\" title=\"Test stand for the DRM2 cards development in Bologna [ALICE]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/test-di-integrazione-delle-schede-DRM2-300x200.jpg\" alt=\"Test stand for the DRM2 cards development in Bologna [ALICE]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/test-di-integrazione-delle-schede-DRM2-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/test-di-integrazione-delle-schede-DRM2.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Test stand for the DRM2 cards development in Bologna [ALICE]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38923 size-medium\" title=\"Test stand for firmware development and repair of the ROD cards [ATLAS]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-e-riparazione-schede-ROD-300x200.jpg\" alt=\"Test stand for firmware development and repair of the ROD cards [ATLAS]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-e-riparazione-schede-ROD-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-e-riparazione-schede-ROD.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Test stand for firmware development and repair of the ROD cards [ATLAS]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38922 size-medium\" title=\"Test setup for the OCTOPAES cards[KM3NeT]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-con-schede-OCTOPAES-300x200.jpg\" alt=\"Test setup for the OCTOPAES cards[KM3NeT]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-con-schede-OCTOPAES-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Setup-di-test-con-schede-OCTOPAES.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Test setup for the OCTOPAES cards[KM3NeT]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38926 size-medium\" title=\"Test setup for the OCTOPAES cards[KM3NeT]  Support to the assembly of the system aimed to monitor the liqud nitrogen level into a dewar for cryogenic SiPM tests [NU@FNAL]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/sistema-di-monitoraggio-300x200.jpg\" alt=\"Test setup for the OCTOPAES cards[KM3NeT]  Support to the assembly of the system aimed to monitor the liqud nitrogen level into a dewar for cryogenic SiPM tests [NU@FNAL]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/sistema-di-monitoraggio-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/sistema-di-monitoraggio.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Support to the assembly of the system aimed to monitor the liqud nitrogen level into a dewar for cryogenic SiPM tests [NU@FNAL]<\/span><\/p>\n<p>\u00a0<\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38915 size-medium\" title=\"Application of Machine Learning Algorithms in FPGA using a ATCA blade (35 x 28.5 cm2, Vadatech ATC136 modified, with \u00a0Xilinx Virtex-7 FPGA and a Four core QorIQ P2040 Power PC) [CMS]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/ATCA-blade-300x200.jpg\" alt=\"Application of Machine Learning Algorithms in FPGA using a ATCA blade (35 x 28.5 cm2, Vadatech ATC136 modified, with \u00a0Xilinx Virtex-7 FPGA and a Four core QorIQ P2040 Power PC) [CMS]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/ATCA-blade-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/ATCA-blade.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Application of Machine Learning Algorithms in FPGA using a ATCA blade (35 x 28.5 cm2,<\/span><br \/><span style=\"color: #4697ba\">Vadatech ATC136 modified, with <\/span>\u00a0<span style=\"color: #4697ba\">Xilinx Virtex-7 FPGA and a Four core QorIQ P2040 Power PC) [CMS]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38917 size-medium\" title=\"Setup of a Crate ATCA 14 U with Backplane 40G FullMesh [CMS]\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Crate-ATCA-300x200.jpg\" alt=\"Setup of a Crate ATCA 14 U with Backplane 40G FullMesh [CMS]\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Crate-ATCA-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Crate-ATCA.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Setup of a Crate ATCA 14 U with<\/span><br \/><span style=\"color: #4697ba\">Backplane 40G FullMesh [CMS]<\/span><\/p>\n<hr \/>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"aligncenter wp-image-38920 size-medium\" title=\"Setup of a Power supply Eltek FlatpackS -48V 9kW 1U for ATCA crates\" src=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Power-supply-Eltek-300x200.jpg\" alt=\"Setup of a Power supply Eltek FlatpackS -48V 9kW 1U for ATCA crates\" width=\"300\" height=\"200\" srcset=\"\/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Power-supply-Eltek-300x200.jpg 300w, \/elettronica\/wp-content\/uploads\/sites\/14\/2020\/05\/Power-supply-Eltek.jpg 450w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><\/p>\n<p style=\"text-align: center\"><span style=\"color: #4697ba\">Setup of a Power supply Eltek FlatpackS -48V 9kW 1U for ATCA crates<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Some assignment highlights of the Electronics Centre &#8211; 2019 \u00a0 Assembly of the test crate for the DRM2 cards at CERN [ALICE] Test stand for the DRM2 cards development in Bologna [ALICE] Test stand for firmware development and repair of the ROD cards [ATLAS] Test setup for the OCTOPAES cards[KM3NeT] Support to the assembly of [&hellip;]<\/p>\n","protected":false},"author":28,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"template-page-builder-no-sidebar.php","meta":{"_lmt_disableupdate":"no","_lmt_disable":"","footnotes":""},"class_list":["post-38791","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"\/elettronica\/wp-json\/wp\/v2\/pages\/38791","targetHints":{"allow":["GET"]}}],"collection":[{"href":"\/elettronica\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"\/elettronica\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"\/elettronica\/wp-json\/wp\/v2\/users\/28"}],"replies":[{"embeddable":true,"href":"\/elettronica\/wp-json\/wp\/v2\/comments?post=38791"}],"version-history":[{"count":22,"href":"\/elettronica\/wp-json\/wp\/v2\/pages\/38791\/revisions"}],"predecessor-version":[{"id":39576,"href":"\/elettronica\/wp-json\/wp\/v2\/pages\/38791\/revisions\/39576"}],"wp:attachment":[{"href":"\/elettronica\/wp-json\/wp\/v2\/media?parent=38791"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}